1. Introduction to the chip under test: The chip is an embedded processor with a core frequency of 600Mhz, built-in 24Mb memory, size BGA576-1.0-25*25mm, open JTAG test channel, and provides high-performance DSP applications.
2. Analysis:
The main purpose of the test socket is to conduct functional testing of the BGA576 DSP chip and at the same time perform aging testing. Based on the actual application status, the accelerated aging test of the chip in extreme environments is tested. In addition to the frequency requirement of 600Mh, this test also needs to pay attention to the aging temperature -45℃~125℃ test requirements, and the corresponding matching needs to be done;
3. Product production and materials:
1. Design the contact medium and physical control structure of the test socket according to the size of the chip; 576Pin 1.0mm spacing and 25*25mm chip size limit to ensure good contact between the chip and the test;
2. The chip test part needs to meet the frequency of 600Mhz and the rate of 1.2Gbps. The JTAG test port can be used to debug and program the IC and perform secondary development. This can be well satisfied by the test socket.
3. What needs to be noted about the aging part of the chip is that the test uses the HAST high-temperature stress accelerated aging test. The aging temperature is 125°C *1000 hours. The materials of the test socket can meet this requirement. The import of Guyi Electronic test socket Engineering materials can meet these needs well and perform well in aging tests.
Logic IC ADI ADSP-TS201SABPZ050
