Industry News
News
  • +8613923728127
  • market@fcssemi.com
  • Room 208 F2 Liutang Building, Road 2 Baomin, Bao-an District Shenzhen City China
19
03-09
Semiconductor reliability testing and test sockets
According to the JESD22-A104 standard, temperature cycling (TC) subjects the parts to changes between extreme high and low temperatures. This test is performed by repeatedly exposing the part to these conditions for a predetermined number of cycles.
18
03-09
Classification of semiconductor test boards (ATE) and PCB processing requirements
Since the unit under test (DUT) area is connected to the pad through the probe, the pad must not be concave or damaged, and the gold surface of the pad must not have scratches or roughness problems.
216
12-12
HALT Testing & HASS Testing
Save time and money in product development using HALT and HASS testing.
345
10-24
Chip companies accelerate “getting on the road”
FCS-KLD EV Chips Test Socket,car chip test socket
223
10-24
247
10-24
BYD Aims At AI Chip Development
FCS AI Chip Test Socket
248
10-24
Vehicle-mounted DSP
FCS-KLD making FCS DSP Test Socket, EV DSP Test Socket
214
10-24
1
Home  | Products  | Solution  | Hot Products  | Service  | News  | About
ShenZhen FCS-KLD Technology co.,ltd 2025 all rights reserved
中文版 中文版