Home News List
News
  • +8613923728127
  • market@fcssemi.com
  • Room 208 F2 Liutang Building, Road 2 Baomin, Bao-an District Shenzhen City China
3
05-22
The Secret of Chip Field Terms: In-depth Interpretation from Professional to Popular (Part 2)
#QFN #QFP #BGA #LGA #PGA #DFN #Chiplet #2.5D #3D #CoWos #FC #FCBGA #FCCSP #SiP #WLCSP #通富 #长电 #华天 #甬矽 #晶方科技 #颀中科技 #伟测 #利扬芯片 #爱德万 #IC #TestSocket #泰瑞达 #ATE
3
05-21
The secrets of the terms in the chip field: in-depth interpretation from professional to popular (I)
Today, let us deeply analyze the key terms in the chip field, from professional interpretation to popular understanding, to take you to understand this sophisticated and complex world in all aspects.
39
03-09
Semiconductor reliability testing and test sockets
According to the JESD22-A104 standard, temperature cycling (TC) subjects the parts to changes between extreme high and low temperatures. This test is performed by repeatedly exposing the part to these conditions for a predetermined number of cycles.
33
03-09
Classification of semiconductor test boards (ATE) and PCB processing requirements
Since the unit under test (DUT) area is connected to the pad through the probe, the pad must not be concave or damaged, and the gold surface of the pad must not have scratches or roughness problems.
37
03-09
KLD customizes CPU/GPU/TPU/FPGA and other high-power chip test sockets to help chip R&D and mass production
Wide compatibility: Supports a variety of package types, including BGA338, BGA484-0.8, BGA516, BGA1275, BGA4755, BGA5602, CPU BGA809, FPGA BGA900, etc., which can meet the testing needs of different manufacturers and different models of chips.
36
03-09
KLD One-stop Automotive xEV Chips Aging Socket Solution
Wide Application Laboratory Aging Verification Third-party Reliability HTOL/HAST Mass Production Aging Selection
77
03-09
KLD Tech customizes and produces a full range of ATE/SLT test sockets for customers
It is widely used in ATE test machines of domestic packaging and testing manufacturers, such as Tongfu, Changdian, Huatian, Yongsi, Jingfang Technology, Qizhong Technology, Vtest, Liyang Chip,
248
12-12
HALT Testing & HASS Testing
Save time and money in product development using HALT and HASS testing.
407
11-09
LTM4644 LTM4600 LTM4600IV BGA package power converter module original LINEAR FCS-KLD BGA77 BGA144 test socket
LTM4644 LTM4600 LTM4600IV BGA package power converter module original LINEAR Kailidi BGA77 BGA144 test socket
385
10-24
Chip companies accelerate “getting on the road”
FCS-KLD EV Chips Test Socket,car chip test socket
389
10-24
RF Chip Test Socket
FCS RF Test Socket,High Frequency Chip Test Socket
236
10-24
1 2 3
Home  | Products  | Solution  | Hot Products  | Service  | News  | About
ShenZhen FCS-KLD Technology co.,ltd 2025 all rights reserved
中文版 中文版