BGA316 old NAND Flash test socket
Product name: BGA316 old NAND Flash test socket
Package size: BGA316
Product Features: According to the details of the NAND flash chip test, for the necessary 184Pin pin-down probes, on the premise of ensuring smooth testing, the best cost-effective pin-down conditions are selected. The single test capability is at 600Mhz frequency capability, which is convenient for the chip. The test was completed with high-speed IOPS.
Product usage: NAND Flash testing, functional verification, aging test, etc.
