2000V high voltage chip QFN test socket
1. Actual requirements:
1.Package: QFN package
2. Number of Pins: 20pin
3. Spacing: 0.65mm
4. Chip type: IGBT high-voltage drive switch chip
5. Test requirements: chip functional debugging, high-voltage impact test
2. Chip characteristics: The chip size is 10*10mm, and the pitch is 0.65mm. Fortunately, the power poles of the chip are all inline structures, with large external operable space, making the design of over-voltage easier. The current S pole and The position of the D pole is large and can be easily matched. We use high-performance conductive materials to match the high voltage of 2000V. This test is a high-voltage impact test. Under normal conditions, it is 500mA, switching frequency 200kHZ, 2W power, 1000 hours Aging function test, 175℃.
3. Demand analysis: The difficult part of this test requirement is that it requires a high-voltage impact of 2000V. This test occurs when the conventional function of 2W, 500mA is aging. The test socket needs to be not only adapted to the impact of 2000V, but also needs to be used at high temperatures. A 1,000-hour functional test was completed at 175 degrees Celsius, which has high requirements on materials, conductivity, etc. In order to match this high-demand test, we used PEEK high-performance engineering plastics and low-impedance dielectric to reduce the risk of high-voltage breakdown.
4. During the production process, each customized component is strictly inspected to confirm that the structure of the chip is within the allowable range. Only after all components are confirmed to be ok can they be assembled, and the overall inspection is completed before shipment.
