DDR4 78 ball test fixture
1. Actual requirements:
1.Package: DDR 78ball universal chip
2. Number of Pins: 78
3. Chip spacing: 0.8mm
4. Chip type: DDR4 chip
5. Testing requirements: functional testing and memory particle functional aging test
2. Demand analysis: The jig is mainly for manual and rapid testing of DDR memory particles. It is mainly based on the current commercial-level testing method and needs to be used with special testing equipment, such as Ouyang software and its corresponding test equipment, etc., such as low-end The end-of-end microcontroller PCIE card method requires a test fixture to adapt to the performance and corresponding structure of the original memory module, and at the same time, it must be manually or automatically matched with the structure.
3. Production: 1. Make a mechanism to cooperate with manual testing, such as a flip-top and push-down structure. It is better to choose a flip-top structure suitable for rapid testing; 2. Choose replaceable limits based on the chip size and possible support. Frame structure, magnetic suction for easy replacement; 3. For contact between the memory motherboard and memory particles, there are probes and conductive glue to choose from. After a variety of functional tests, the conductive glue with better performance was selected. The conductive glue is light and thin, and the conductive part is The internal resistance is very low, suitable for various frequencies and high current requirements; 4. The external structure adopts a solid and durable thick alloy structure, which plays a good role in the entire long strip memory structure.
4. After the production is completed, the original chip can be used for testing, and special equipment and servers can be used to perform corresponding tests. After cycle testing with good and bad chips, confirm that the test condition is ok. The memory particles of 78ball are generally 8bit. With the assistance of testing and software, it can test the quality of 8 ICs at the same time, which can greatly improve the testing efficiency.
