Power-Transistor flip aging test seat

  •  Power-Transistor flip aging test seat

Power-Transistor flip aging test seat

Package size: HDSOP16, pitch 1.2mm, size 9.9*15mm

Test support: test environment temperature -45~155℃; relative humidity RH 85%, test duration 1000 hours

Product features: Suitable for manual rapid mass testing. The top window facilitates the installation of external thermal probes and heat dissipation components. At the same time, the peripheral avoidance and insulation design ensure the safety of the test chips.

Product usage: Specially packaged chips are customized, HAST/HTOL and other aging tests, reliability tests, and manual tests are also performed.

Power-Transistor flip aging test seat

 Power-Transistor flip aging test seat

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