QFN20-0.65 high voltage functional aging test socket

  • QFN20-0.65 high voltage functional aging test socket

QFN20-0.65 high voltage functional aging test socket

Package size: 0.65mm pitch, 8*8*0.7mm

Test support: The power consumption during chip testing is 2W, and the maximum current used is 500mA, which can support the chip's transient ns-level high-voltage 2200v impact test;

Product Features: Suitable for high voltage testing 2200V

IC purpose: high voltage IGBT switching power supply chip

Product Highlights: Resistant to high voltage 2200V

QFN20-0.65 high voltage functional aging test socket

QFN20-0.65 high voltage functional aging test socket

Home  | Products  | Solution  | Hot Products  | Service  | News  | About
ShenZhen FCS-KLD Technology co.,ltd 2024 all rights reserved
中文版 中文版