1. Requirements: CLCC package, 1.27mm, size: 10*10mm, chip structure is FR-4 substrate + top CMOS device, total height 1.9mm, make a test socket that can be used for rapid manual testing; this chip does not have high speed and high frequency High current requirements; test temperature is -40~85℃, maximum frequency 40MHz, 0.5A/pin current, top window is suitable for CMOS image detection and installation lens coordination;
2. Analysis:
1. Analysis of the size of the chip. According to the current size, the structure of the product is easy to implement. However, the size of the chip is relatively thin. It is necessary to consider the cooperation of pressing, limiting, and window size to avoid overvoltage and crushing of peripheral components. Case;
2. Open the window according to the requirements provided by the chip size, but at the same time, it should be noted that a flat position is reserved on the top for users to install their own lenses;
3. The low frequency and small current of the chip can be matched with low-impedance probes for easy cooperation, and the round-head pin type is used to reduce the possibility of pad scratches;
4. The test adopts the form of a button at the bottom to facilitate users to quickly test;
3. Product production and materials:
1. The actual chip being tested is 3~5pcs; the chip of the PCB base material may have large tolerance problems;
2. Plan and complete the design drawings according to the actual objects and drawings;
3. Machining and production of various accessories;
4. At the end of production, the size and quality of each accessory will be tested. If the test is OK, it will be sent to the assembly department for assembly. If the test fails, it will be sent back for rework or remanufacturing; if all the accessories are OK, the assembly process will be arranged;
5. After the assembly is OK, the overall size and quality of the test seat will be tested again. If the test is OK, it will be shipped. If it fails, it will be reworked. If everything is OK, it can be shipped;
CLCC24-1.27 CMOS image sensing test socket