DFN8-1.27-6×8 aging test seat

Package size: DFN8 package, pitch 1.27mm, size 6*8mm

Test support: -45~125℃, aging and aging test of consumer-grade SD NAND IC and Nor flash chip;

Product features: It adopts pogo pin gold-plated probe structure, adapts to aging tests in extreme environments, and performs well in high, low, and high-humidity environments;